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H. von Bardeleben, Jean-Louis Cantin, A. Parisini, A. Bosio, R. Fornari. Conduction mechanism and shallow donor properties in silicon-doped ɛ -G a 2 O 3 thin films: An electron paramagnetic resonance study. Physical Review Materials, 2019, 3 (8), pp.084601. ⟨10.1103/PhysRevMaterials.3.084601⟩. ⟨hal-03924960⟩
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Abdo Hassoun, Shahida Anusha Siddiqui, Slim Smaoui, İ̇lknur Ucak, Rai Naveed Arshad, et al.. Emerging Technological Advances in Improving the Safety of Muscle Foods: Framing in the Context of the Food Revolution 4.0. Food Reviews International, 2022, pp.1-42. ⟨10.1080/87559129.2022.2149776⟩. ⟨hal-04032389⟩
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Bingbing Xia, Jean-Jacques Ganem, Ian Vickridge, Emrick Briand, Sébastien Steydli, et al.. Water-rich conditions during titania atomic layer deposition in the 100 °C-300 °C temperature window produce films with TiIV oxidation state but large H and O content variations. Applied Surface Science, 2022, 601, pp.154233. ⟨10.1016/j.apsusc.2022.154233⟩. ⟨hal-03907172⟩
Dépôts en texte intégral
93
Mots clés
Nanostructures
Sputtering
Nuclear resonance profiling NRP
Zinc oxide
13C
Epitaxial growth
Gold
Aluminum
Alloy
27Ald p&α
7550Ee
Nickel
Al2O3
Adsorbed layers
Indium oxide
Isotopic Tracing
Silicon Carbide
RBS
Magnetic semiconductors
18O
Capillary condensation
Alloys
Magnetization curves
Rutherford backscattering spectrometry RBS
Magnetic anisotropy
AC susceptibility
Charge exchange
6855Jk
Interface defects
15N
27Aldp
Diffusion
Aluminium
EPR
Raman spectroscopy
Multilayer
Measurement
Low energy electron diffraction LEED
Annealing
HfO2
Nuclear reaction analysis
Photoluminescence
2H
Density functional theory
Kossel diffraction
Growth
PIXE
Acoustic propreties of solid
27Alda
Gallium oxide
Auger electron spectroscopy AES
Ion beam analysis
Topological defects
Acoustic
17Opp
17O
Adsorption
ALD
Epitaxy
Thin films
Silica
Periodic multilayer
Hysteresis
Ion implantation
XPS
3C-SiC
Silicon
X-ray diffraction
Adsorption Isotherms
Ageing
18O resonance
Transparent conductive oxide TCO
Stable isotopic tracing
Pb centers
Nanoparticles
Passivation
AFM
Pulsed laser deposition
Atomic Layer Deposition ALD
Energy loss
SiC
NRP
ADSORPTION DESORPTION HYSTERESIS
Thin film
7550Pp
Oxygen deficiency
Oxidation
Evaluation
Silicon carbide
17Op
8140Ef
Metal-insulator transition
GaMnAs
Nitridation
Channeling
Ferromagnetic resonance
7630Lh
Defects
Topological insulators
XRD